Kyocera Corporation announced that its solar modules have again passed independent quality testing with flying colors after the non-profit Fraunhofer Center for Silicon Photovoltaics CSP (Halle, Germany) disclosed the results of its potential induced degradation (PID) test which demonstrated that Kyocera's modules did not show any degradation after being subjected to high voltage stress testing. The results of this third-party test illustrate the high quality and high reliability of Kyocera's modules - which are born of the company's more than 35 years of experience in the industry and its quality-focused manufacturing process.
Earlier this year, Fraunhofer CSP anonymously acquired and independently tested modules from 13 well-known manufacturers; subjecting the modules to a high voltage stress test (50 deg. C, 50% relative humidity, -1000V, aluminum film at the front side, 48 hours). Kyocera was one of only four manufacturers whose modules passed the test without showing any degradation, while other companies' modules showed partial to significant degradation. These results highlight a stark divide between different companies' modules – while distinguishing Kyocera among a select number to be proven as PID resistant.
"As a pioneer in the industry Kyocera has been involved in R&D and manufacturing of solar power generating systems for more than 35 years, and in that time we have developed numerous innovations and manufacturing technologies to ensure the high quality and long-term durability of our products," said Tatsumi Maeda, general manager of the Kyocera Corporate Solar Energy Group. "With Kyocera's solar modules having been the first in the world to be certified by TUV Rheinland's Long-Term Sequential Test, the Fraunhofer CSP test results further demonstrate the industry-leading technology and reliable performance of Kyocera modules."
